3D X-Ray Microscopy

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Medical Devices
The NPFLEX-LA™ Non-Contact, 3D Surface Metrology System for Lead Angle is the first comprehensive, non-contact metrology solution that repeatably quantifies true lead angle and surface texture on dynamic sealing surfaces.
The fully automated, large-sample ContourGT-X 3D Optical Microscope combines unmatched measurement capabilities with highest vertical resolution over the industry’s largest field of view.
Utilizing the latest advances in white light interferometry technology, the ContourGT InMotion™ 3D Optical Microscope performs three-dimensional surface measurements of features from 0.1nm to 10mm in height for devices as they actuate.
The NPFLEX™ provides the most flexible, non-contact, 3D areal surface characterization for such large samples as orthopedic medical implants and the larger parts in aerospace, automotive and precision machining industries.
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry.
The Xradia Versa family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. Xradia 510 Versa advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challenges.
The ContourGT-I 3D Optical Microscope combines over three decades of surface metrology innovation and experience from industry partnerships into a single bench top system to deliver production-ready automation, measurement angle flexibility, outstanding imaging, and proven gage-capable performance.
Xradia 800 Ultra is the only lab based ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes. The precision of X-ray focusing optics delivers a resolution as fine as 50 nm, seamlessly extending the capabilities of X-ray CT beyond those of conventional scanners.
The ContourGT-K 3D Optical Microscope sets a new industry standard in design and cost for surface metrology performance. With exceptional roughness and 2D/3D measurement capabilities, high-resolution imaging and the industry’s most advanced user friendly interface, the system offers uncompromised metrology in a simplified package with a compact footprint.
Xradia 520 Versa frees researchers to push the boundaries of lab-based imaging. With prominent facilities worldwide using non-destructive X-ray microscopy (XRM) to extend the use of valuable samples, the ZEISS Xradia Versa family proves a powerful component of a correlative microscopy solution
The ZEISS Xradia 410 Versa encompasses all the benefits of the VersaXRM family of 3D X-ray microscopes for computed tomography. Xradia 410 Versa is uniquely designed to bridge cost/performance standards for a broad range of scientific research.