Continuing more than 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis.
The HT7710's radical design incorporates the ergonomics and user friendliness of a SEM with the advanced resolution and analytical capabilities of a TEM/STEM. It features completely digital imaging supported by a redesigned viewing chamber which accommodates Hitachi’s brightfield and darkfield STEM detectors.
STEM Performance for Soft/Hybrid Materials - 40-120kV with a magnification range of 100‑800,000X and image recording resolutions up to 5120 X 3840
High Magnification and Large FOV STEM - Ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis
Flexible Port Configurations - BF/DF STEM, EDS detectors, and cameras for high-throughput imaging and compositional data
Intuitive STEM GUI and Automation Features - All STEM images instantly archived in Hitachi’s EMIP database software
Optional High-Resolution Objective Lens - 1.4Å at low accelerating voltages with minimal beam damage