Ion Milling Systems

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Medical Devices

IM4000 Ion Milling System from Hitachi

The Hitachi IM4000 Ar ion milling system makes two milling configurations available in a single instrument. While previously two separate systems were needed to perform both, cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), Hitachi's new IM4000 now allows to run both applications within the same machine.

EM RES101 Ion Milling System from Leica

The Leica EM RES101 is a fully computer-controlled ion milling system with the highest level of user flexibility, which combines the preparation of TEM, SEM, and LM samples in one bench-top instrument.

IM 150 Ion Milling System from Oaresearch

The IM 150 ion milling system consist of small-footprint, front-door loading system comprises an RF50/150 ion source with autotune, plus a versatile water-cooled specimen holder with provision for tilt, rotation and bias.

Model 1010 Ion Milling System from Fischione

The Model 1010 Ion Mill is a tabletop, PC-controlled precision milling and polishing system for creating high-quality TEM specimens with large electron transparent areas. It is fully programmable and easy to use.

ATC 1800-IM Ion Milling Systems from AJA International

The ATC 1800-IM ion milling systems are versatile tools that can be built in a wide variety of configurations. Depending on your application, these custom designed systems utilize state of the art substrate holders and ion sources.

α120 Ion Beam Milling System from Nordiko

Building on twenty years of experience in delivering RF based ion beam systems Nordiko introduces the α120. This laboratory system comprises a vacuum process module, mounted on a cabinet housing supporting power supplies and power management systems.

7000 Broad Ion Beam Milling System from Nordiko

The Nordiko 7000 broad ion beam milling system is a fully automatic large area equipment. Equipped with an rf excited ion source, providing low divergence ion beams from 15 to 25 cm diameter.

EM RES102 Ion Beam Milling System from Leica

Thin, clean, polish, cut slopes and structure samples with the highest level of flexibility is obtained in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.

695 Precision Ion Polishing System II (PIPS II) from Gatan

The Precision Ion Polishing System II (PIPS II) is a revolutionary enhancement of the PIPS ion mill system which has defined the standard for TEM sample preparation for 20 years.

7500 Broad Ion Beam Milling System from Nordiko

The 7500 represents a fresh look at Broad Ion Beam Milling. The system is designed around our new 50 cm plasma source and a new high reliability rotary substrate table.

ATC ORION-IM Ion Milling System from AJA International

The ATC ORION-IM ion milling systems are versatile tools that can be built in a wide variety of configurations. Depending on your application, these custom designed systems utilize state of the art substrate holders and ion sources.