SU3500 Scanning Electron Microscope from Hitachi

The completely new SU3500 SEM features novel and innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 SEM will be the workhorse microscope in any laboratory.

Features

  • Even better resolution SE 7nm at 3kV, BSE 10nm at 5kV
  • New Gun Bias System and Image Signal Processing allows quick and easy focus adjustment and astigmatism correction
  • High speed Automatic Focus Control (AFC) and Auto Brightness & Contrast Control (ABCC) function enable faster and optimized image observation
  • The new Ultra Variable-Pressure Detector (UVD) is a highly sensitive detector for low vacuum mode
  • The new Live Stereoscopic function allows the observation of Stereo SEM image without need for specimen tilting.

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