The Phenom XL Scanning Electron Microscope (SEM) expands the boundaries of compact desktop SEM performance. It features the established user-friendly and quick time-to-image of any Phenom system.

It is provided with a chamber that allows examination of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism guarantees the fastest vent/load cycle in the world, providing the maximum throughput.

A recently developed compact motorized stage enables users to scan the total sample area, and although a desktop SEM, the Phenom XL needs little space without the need for additional facilities.