EM RES102 Ion Beam Milling System from Leica

Thin, clean, polish, cut slopes and structure samples with the highest level of flexibility is obtained in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.

A variety of sample holders allows  a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy