IG-1000 Plus Single Nano Particle Size Analyzer

The IG-1000 Plus Single Nano Particle Size Analyzer: An Instrument That Goes Beyond the Single Nano Region and Enters the Sub Nano Region

This instrument uses the induced grating (IG) method, which is based on a new principle for measuring the size of nanoparticles using the phenomenon of dielectrophoresis and diffracted light.

With dynamic light scattering, the conventional method, the light scattered by particles decreases sharply for particle sizes of less than 100 nm. Furthermore, in the single nano region (i.e., particle sizes of less than 10 nm), there are physical restrictions that make it difficult to detect scattered light, and the measurement of particle sizes also becomes difficult. The IG method does not use scattered light and so it is free from these physical restrictions, and does not require the input of the refractive index as a measurement condition. It therefore allows the size of nanoparticles to be measured simply and with high sensitivity,and is particularly effective in the analysis of single nanoparticles.

High-Sensitivity Analysis of Single Nanoparticles

Optical signals emitted by the diffraction grating formed by the particles, not scattered light emitted by the particles, is used for measurement and so, even in the single nano region, a sufficient S/N ratio can be obtained, and stable measurement with good reproducibility is possible.

Resistance to Contamination

The new measurement principle is resistant to contamination and so, even if the sample is mixed with small amounts of foreign particles, information about the particles to be analyzed is still caputured. Therefore the filtering of samples in order to remove coarse particles is not required.

High Reproducibility

The new measurement method ensures high reproducibility and the acquisition of stable data. In particular, high reproducibility for particle sizes of less than 10 nm removes the uncertainty and vagueness of particle analysis in the single nano region. Also, comparison with raw data of diffracted light is possible and so rough validation of the measurement results can be performed simply.