LS 13 320 XR Particle Size Analyzer from Beckman Coulter Life Sciences

The LS 13 320 XR analyzer available from Beckman Coulter Life Sciences provides superior particle size distribution data from sophisticated PIDS technology, thus facilitating expanded dynamic range and high-resolution measurements.

Similar to the LS 13 320 analyzer, the XR particle size analyzer offers rapid, precise results and helps users to streamline workflows to enhance efficiency. The LS 13 320 XR analyzer ensures huge improvements that help users to reliably spot even small differences, which could have a huge effect on their particle analysis data.

  • Direct measurement range of 10 nm to 3500 µm
  • New control standards sufficiently verify module/instrument performance
  • Improved software streamlines method creation for standardized measurements
  • Pass/fail results are highlighted automatically for more rapid quality control

Features

Spot small differences

  • Laser diffraction combined with sophisticated Polarization Intensity Differential Scattering (PIDS) technology allows high-resolution measurements and real data reporting down to 10 nm
  • Extended measurement range of 10 nm to 3500 µm
  • Reliable, precise detection of multiple particle sizes in a single sample

User-friendly software

  • ADAPT Software ensures automatic pass/fail verification
  • Single-click overlay with historical data
  • Insightful user diagnostics keep users informed when sampling is performed
  • Preset methods offer results with 3 or fewer clicks
  • Simplified method creation for standardized measurements
  • Analyzer functioning by both experts and new users simplified

ADAPT Software enables 21 CFR Part 11

  • Customizable security system for fulfilling varied requirements
  • Users can choose from four security levels
  • High-security configuration complies with 21 CFR Part 11

PIDS technology for direct detection of 10 nm particles

  • The analyzer can measure light scattered from samples over a wide array of angles
  • Samples with vertical and horizontal polarized light irradiated by three light wavelengths (450, 600, and 900 nm)
  • Differences between vertically and horizontally radiated light for each wavelength produce high-resolution particle size distribution data

Specifications

Source: Beckman Coulter Life Sciences

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Light Source Diffraction: Solid-state (780 nm) PIDS: Tungsten lamp with high-quality band-pass filters (450, 600 and 900 nm)
Particle Size Analysis Range 10 nm - 3500 µm
Fluid Compatibility Emulsions, Suspensions, Powders
Reporting PDF, Excel
Item Specifications Referenced B98100

LS 13 320 XR Particle Size Analyzer

Image Credit: Beckman Coulter Life Sciences

LS 13 320 XR Particle Size Analyzer

Image Credit: Beckman Coulter Life Sciences