To better understand cellular functions in a complex 3-D context, volume microscopy at high resolution is a key application. However, most of the existing methods are time consuming and cumbersome with lengthy sample preparation procedures to target precisely the region of interest before data collection and volume reconstruction can be done.
Achieving optimal contrast can also be challenging in volume imaging schemes for automatic data analysis and reconstruction.
Scios, with its unique and flexible detection scheme, offers simultaneous detection of all information with excellent contrast at high acquisition speeds and high resolution at low kV. Thus, it is ideal for imaging a wide range of samples including very sensitive materials.
Fully automated column alignments limit the need for highly trained operators while predefined use cases for common conditions gives instant productivity to everyone, especially relevant to multi-user facilities.
With efficient and value adding workflows, Scios enables results in the shortest possible time with great accuracy. The Amira SDB wizard streamlines the steps necessary for accurate analysis and visualization of 3D data sets acquired on Scios.
CLEM (Correlative Light and Electron Microscopy) targeted AutoSlice & View provides a true workflow solution in finding the precise location of the region of interest in a large volume for high resolution imaging and simplified high precision cryo-TEM sample prep offers highest yield without contamination even for challenging samples.
- Excellent contrast paired with high acquisition speeds and high resolution at low kV
- Flexible detection schemes for simultaneous acquisition of all relevant information
- Instant productivity for all operators with unique user guidance and advanced automation
- Workflow solutions for increased productivity: Amira Analysis wizard, CLEM targeted AS&V and CryoTEM sample preparation