Medical Devices | Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

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Medical Devices
JSM-6510 Scanning Electron Microscope from Jeol
The JSM-6510 is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures.
SU3500 Scanning Electron Microscope from Hitachi
The completely new SU3500 SEM features novel and innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions.
S-3700N Scanning Electron Microscope from Hitachi
The S-3700N has been developed with widely diversified applications in mind. The S-3700N has a huge sample chamber and can accommodate samples as large as 300mm in diameter and 110mm high.
SU1510 Scanning Electron Microscope from Hitachi
The SU1510 is a medium size chamber Variable Pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly improves low voltage performance and increases beam current well suited for today's SDD X-ray detectors.
Verios XHR Scanning Electron Microscope from FEI
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications.
S-3400N Scanning Electron Microscope from Hitachi
The new Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily, and/or non-conductive samples without metal coating or other complicated specimen preparation techniques.
Nova NanoSEM Scanning Electon Microscope from FEI
The FEI Nova NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
JASM-6200 Scanning Electron Microscope ClairScope from Jeol
ClairScope consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top.
JSM-7001F Scanning Electron Microscope from Jeol
The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use.
JSM-7500F Scanning Electron Microscope from Jeol
The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1 kV.
Magellan XHR Scanning Electron Microscope from FEI
The Magellan XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer.