Scanning Electron Microscopes (SEM)

The scanning electron microscope is a type of electron microscope that produces images of a sample by scanning it with a high-energy beam of electrons. The SEM is significantly more powerful than a light microscope, and can produce images of up to 500,000 times greater magnification. The SEM can generate precise images of organisms as tiny as viruses and bacteriophages.

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Medical Devices
The new Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily, and/or non-conductive samples without metal coating or other complicated specimen preparation techniques.
Revealing the hidden treasures of all features on your sample is now possible with Phenom-World's Motorized Tilt & Rotation Sample Holder.
The Temperature Controlled Sample Holder has been developed by Phenom-World and Deben in order to study vacuum-sensitive and vulnerable samples such as biological, food or organic coatings.
The S-3700N has been developed with widely diversified applications in mind. The S-3700N has a huge sample chamber and can accommodate samples as large as 300mm in diameter and 110mm high.
The Phenom Pro desktop SEM from Phenom-World is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
The Phenom ProX desktop scanning electron microscope from Phenom-World is the ultimate all-in-one imaging and X-ray analysis system.
The FEI Nova NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
The Phenom Pure desktop SEM (scanning electron microscope) from Phenom-World is an ideal tool for making the transition from working with a light microscope to operating an electron microscope.
The SU1510 is a medium size chamber Variable Pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly improves low voltage performance and increases beam current well suited for today's SDD X-ray detectors.
The Magellan XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer.
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications.
The completely new SU3500 SEM features novel and innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions.