Scanning Electron Microscopes (SEM)

The scanning electron microscope is a type of electron microscope that produces images of a sample by scanning it with a high-energy beam of electrons. The SEM is significantly more powerful than a light microscope, and can produce images of up to 500,000 times greater magnification. The SEM can generate precise images of organisms as tiny as viruses and bacteriophages.

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Medical Devices
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications.
The FEI Nova NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
The completely new SU3500 SEM features novel and innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions.
The Magellan XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer.
The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1 kV.
The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use.
ClairScope consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top.
The SU1510 is a medium size chamber Variable Pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly improves low voltage performance and increases beam current well suited for today's SDD X-ray detectors.
The S-3700N has been developed with widely diversified applications in mind. The S-3700N has a huge sample chamber and can accommodate samples as large as 300mm in diameter and 110mm high.
The JSM-6510 is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures.
The new Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily, and/or non-conductive samples without metal coating or other complicated specimen preparation techniques.