The Xradia Versa family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. Xradia 510 Versa advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challenges. The system's source technology and high resolution detector provide unmatched sub-micron resolution, even for large samples.
Benefits
- Microscope design enables highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging
- Multi-length scale imaging of the same sample across a wide range of magnifications, down to <0.7 µm True Spatial Resolution™
- Supports a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 15 kg