A team of researchers from Boston University has developed a new application to enable more precise measurement of the location of a fluorescent label in a DNA layer.
According to their study, published in a recent issue of Proceedings of the National Academy of Sciences, the new technique provides insight into the shape of DNA molecules attached to a surface, such as microarrays used in genomics research. Determining specific information about how surface-bound DNA molecules conform may significantly improve the efficiency of DNA hybridization and microarray technology and thus impact emerging clinical and biotechnological fields.
The technique, called spectral self-interference fluorescence microscopy (SSFM), maps the interference spectrum from a fluorophore (fluorescent molecule) label located on a layered reflecting surface into a position with sub-nanometer accuracy. "Although a number of other methods have been used to determine the structure of the DNA layer, they are not very sensitive to variations in the shape of DNA molecules," said Bennett Goldberg, professor of physics and study co-author. "Our group has developed SSFM to determine the precise measurement of the location of a fluorescent label relative to the microarray surface which provides us with specific information about the conformation of DNA molecules."