SolidSpec-3700/3700DUV VIS NIR Spectrophotometer from Shimadzu

Shimadzu SolidSpec-3700/3700DUV are the top-of-the-line spectrophotometer with high sensitivity, deep UV measurement and a large sample compartment. The SolidSpec-3700/3700DUV respond to the following requirements in optical, semiconductor and FPD applications.

FPD:

High-sensitivity measurement in NIR and a large sample compartment for material evaluation

Semiconductors:

Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement

Optical communications:

High-sensitivity measurement of anti-reflection films in NIR

Optics:

High-sensitivity measurement from deep UV to NIR, and a large sample compartment