The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.
Some of the unique advantages of nanoparticle characterization with an AFM include:
- Characterization of nanoparticles that are 0.5 nm in diameter and larger.
- Nanoparticle mixture distributions below 30 nm.
- Characterization of variable geometry nanoparticles.
- Direct visualization of hydrated nanoparticles/liquid medium.
- Characterization of nanoparticle physical properties such as magnetic fields.
Characterization of nanoparticles that are 0.5 nm in diameter and above
An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.
The AFM can easily identify and characterize bi-modal distributions of nanoparticles. AFMWorkshop's built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.
Variable geometry nanoparticles
The AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.
AFM analysis of hydrated samples/liquid medium
The atomic force microscope's ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.
Nanoparticle Physical Properties
Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.
Nanoparticle Size Analysis
A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three dimensional structure of the nanoparticles.
Specialized software algorithms allow the nanoparticles in the image to be identified and then counted. Additionally, critical sample image dimensions such as height, volume, surface area, and perimeter may be calculated and displayed.
Using data from the image analysis software module, a histogram of the nanoparticle distributions can be calculated.