Optical Imaging AFM - SNOM, TERS and More

The new NanoWizard® 3 NanoOptics AFM is optimized for a broad range of applications ranging from nanoscale optical imaging by aperture and scattering-type SNOM to experiments involving interactions of light with the sample such as absorption, excitation, nonlinear effects and quenching.

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Key Features

  • QI™ quantitative imaging mode for the most challenging of AFM samples
  • Comprehensive solutions for AFM and Raman spectroscopy, Tip-Enhanced Raman Spectroscopy (TERS), Aperture SNOM and Scattering-type SNOM (sSNOM), Confocal microscopy, NanoManipulation in optical fields
  • Compatible with most commercially available inverted research microscopes (Zeiss Axiovert and Axio Observer lines, Nikon TE and Ti lines, Olympus IX line and Leica DMI line)
  • Unique integration with optical microscopy by tip and sample scanning design, DirectOverlay™ mode and smart engineering
  • Seamless integration with inverted microscopes, Raman spectrometers, photon counting systems
  • Highest stability and lowest drift for long term experiments
  • Up to 6 axes closed-loop scanning (3 by tip and 3 by sample) with the TAO™ module
  • Designed for optimum imaging in air or liquid with excellent resolution, lowest noise and maximum versatility
  • Expanded flexibility with the widest range of modes and accessories with the Vortis™ controller and the latest NanoWizard® software
  • 980nm laser source for cantilever deflection detection prevents cross talk with other wavelengths
  • Wide range of operation modes and accessories such as Tuning Fork, STM, Conductive AFM, Fiber SNOM