New generation of FIB-SEMs presented by Zeiss

ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation.

Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput e.g. for cross-sectioning, TEM lamella preparation or nano-patterning.

ZEISS Crossbeam 550 provides best image quality in 2D and 3D. The new Tandem decel mode enables enhanced resolution together with a maximization of image contrast at low landing energies. The pioneering Gemini II electron optics delivers optimum resolution at low voltage and high probe current simultaneously.

The FIB column combines the highest available FIB current of 100 nA with the new FastMill mode, allowing for highly precise and more efficient material processing and imaging in parallel. Additionally, the new process for automated emission recovery increases the user-friendliness and optimizes the FIB column for reproducible results during long-term experiments.

Material scientists profit from excellent 3D analytical properties, especially thanks to the also new, fully integrated module for 3D EDS analyses with ZEISS Atlas 5. In the life sciences, ZEISS Crossbeam 550 convinces with its enhanced resolution at low voltages and an outstanding stability for long-term 3D tomography. Moreover, it is possible to optimally integrate the new workstation into correlative workflows and to combine it with light, X-ray or ion beam microscopy.

Source:

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Carl Zeiss Microscopy GmbH. (2019, June 19). New generation of FIB-SEMs presented by Zeiss. News-Medical. Retrieved on November 12, 2019 from https://www.news-medical.net/news/20170420/New-generation-of-FIB-SEMs-presented-by-Zeiss.aspx.

  • MLA

    Carl Zeiss Microscopy GmbH. "New generation of FIB-SEMs presented by Zeiss". News-Medical. 12 November 2019. <https://www.news-medical.net/news/20170420/New-generation-of-FIB-SEMs-presented-by-Zeiss.aspx>.

  • Chicago

    Carl Zeiss Microscopy GmbH. "New generation of FIB-SEMs presented by Zeiss". News-Medical. https://www.news-medical.net/news/20170420/New-generation-of-FIB-SEMs-presented-by-Zeiss.aspx. (accessed November 12, 2019).

  • Harvard

    Carl Zeiss Microscopy GmbH. 2019. New generation of FIB-SEMs presented by Zeiss. News-Medical, viewed 12 November 2019, https://www.news-medical.net/news/20170420/New-generation-of-FIB-SEMs-presented-by-Zeiss.aspx.

Comments

The opinions expressed here are the views of the writer and do not necessarily reflect the views and opinions of News-Medical.Net.
Post a new comment
Post
You might also like... ×
Multi-modal workflows reflected in new ZEISS ZEN 2 imaging software