Bruker announced today at the 2012 Materials Research Society (MRS) Fall Meeting the release of a new line of IRIS TERS Probes. By enabling Tip-Enhanced Raman Spectroscopy (TERS), the new IRIS TERS probe tips provide users a complete path to non-destructive, label-free chemical detection at the nanoscale. As sharp, solid-metal cones, IRIS TERS Probes are designed to deliver the highest Raman enhancement, which translates to highest sensitivity and spatial resolution. Together with Bruker's Innova-IRIS system, and third-party research Raman systems, IRIS TERS Probes can create the highest-performance complete commercial TERS solution.
“With their proven TERS contrast capability, the IRIS TERS Probes are an expression of our commitment to moving atomic force microscopy beyond just imaging”
"It is widely understood in the TERS community that the single issue preventing further adoption is lack of available high-performance probes," said Mark R. Munch, Ph.D., President, Bruker MAT Group and Bruker Nano Surfaces Division. "By addressing this key gap, we are making TERS more widely available, addressing the unmet need for nanochemical identification."
"With their proven TERS contrast capability, the IRIS TERS Probes are an expression of our commitment to moving atomic force microscopy beyond just imaging," added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business. "The nanoscale chemical information provided by our complete TERS solution joins our recent advances in quantitative nanoscale property mapping with PeakForce QNM®, PeakForce TUNA™, and PeakForce KPFM™."
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