Mar 3 2010
ASPEX Corporation (ASPEX) has been advancing the novel Personal Scanning Electron Microscope (PSEM) platform since its first product generation was released in 1992. Since then, it has been "shifting" where SEMs are traditionally installed, "shifting" when SEMs are utilized in industrial processes, and fundamentally "shifting" how SEMs are identified. Come experience the shift at Pittcon 2010, in Orlando, FL from March 1-4.
At Booth #507, ASPEX will display its game-changing PSEM eXpress™, a benchtop analyzer that is smaller and more cost-effective than traditional scanning electron microscopes. Since its debut, the PSEM eXpress™ has been solving real-world quality control issues in a variety of industries, including industrial automation, metals, health sciences, and forensics. Additionally, ASPEX will present a poster session highlighting the "Implementation of Next Generation Electron Beam Analyzer in Contamination Diagnostics" at the Blue Area, Hall A2, Aisles 700-1300 on Monday, March 1st, 2010.
"The PSEM eXpress™ represents several new advancements, from more functional product packaging, to one-click reporting," said Greg Ott, President of ASPEX. "Not only does the PSEM eXpress™ illustrate yet again another shifting of the identity of SEMs, but it represents ASPEX's response to the marketplace. Reliability, performance, and value are what we strive to deliver as product features. Based on market feedback, the PSEM eXpress™ has continued the brand in grand style."
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